Silicon Frontline Ends 2010 with New Customers and Most Successful Quarter to Date
Applications Focus Catalyzes Interest in Accurate 3-D Extraction and Post-Layout EDA Software
Silicon Frontline Technology, Inc. (SFT), an Electronic Design Automation (EDA) company in the post-layout verification market focused on solutions for nanometer design applications, announced today that the company ended 2010 with new customers and its most successful quarter to date. The company was founded in 2007 and began shipping its software in May 2009.
“We ended the year with a customer list approaching 30 companies and another profitable quarter,” said Yuri Feinberg, CEO. “We added multiple new customers in the last quarter and our existing customers renewed or increased their orders for our highly accurate 3D post-layout extraction software products – F3D for fast 3D extraction and R3D for fast resistive 3D extraction.”
Silicon Frontline’s software has been used to accurately verify over 300 electronic designs to date. The company’s customers use its software to analyze power devices, improve image sensors, ADCs, flash memories, differential signals and nanometer and Analog Mixed Signal (A/MS) designs. The customer list includes 10 of the world’s top 30 semiconductor companies. In addition, leading foundries have validated Silicon Frontline’s products for use with their nanometer design technologies and reference flows.
Silicon Frontline’s post-layout verification software delivers Guaranteed Accuracy, full-chip capacity and performance at least 20 times faster than other commercial field solvers. Users specify the level of accuracy desired, net by net, at the block level or with regular expressions. In this way, the resulting parasitics are guaranteed correct within the specified accuracy range for better design quality.
About Silicon Frontline’s Products
F3D (Fast 3D) is used for fast 3D extraction and R3D (Resistive 3D) is used for 3D extraction and analysis of large resistive structures. F3D is chosen for its nanometer and Analog Mixed Signal (A/MS) design verification accuracy, and R3D for analysis that leads to improvements in the reliability and efficiency of semiconductor power devices.